June 22, 2016, National Instruments and its NI Platinum Alliance Partner NOFFZ Technologies are hosting a Technology Day on the topic RF and Wireless Test, to which we would like to invite you.
Watch the development of the Industrial Internet of Things (IIoT) taking shape: According to a prognosis by Gartner, in this year alone, 5.5 million new devices will get connected every day. RF test systems have to keep up with this progress. Therefore, we see it as our mission to provide a versatile, scalable platform in order to be able to test the increasingly smart devices time and cost effectively. While mobile devices such as smart phones, tablets, and smart watches pose a challenge in the consumer sector, so do eCall, NAD, CarToCar, or Telematik modules in the automobile industry.
The technology day will enable you to stay on track with the newest trends in the entire product development process for RF tests. Do not miss out the opportunity to experience PXI-based RF measurement technology with a hands-on approach.
The main topics include:
• Mobile Device Test
• Communication System Design
• RF Validation & Manufacturing Test
• Multi DUT RF Test for Cellular and Connectivity Applications
• Non-Signaling Chip Testing
• Near Field Communication (NFC) & Wireless Power Charging (WPC)
Through our combination of technical presentations, workshops, and the accompanying exhibition we offer you a valuable networking platform. Of course, our experts are also happy to discuss your individual projects.
NOFFZ ComputerTechnik GmbH